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Export Reference (APA) 
Bravo, J. & Vitor Santos (2022). Backtesting Recurrent Neural Networks with Gated Recurrent Unit: Probing with Chilean Mortality Data. In Advances and Applications in Computer Science, Electronics, and Industrial Engineering. CSEI 2021.
Export Reference (IEEE) 
J. M. Bravo and V. Santos,  "Backtesting Recurrent Neural Networks with Gated Recurrent Unit: Probing with Chilean Mortality Data", in Advances and Applications in Computer Science, Electronics, and Industrial Engineering. CSEI 2021. , 2022, vol. 433
Export BibTeX 
@incollection{bravo2022_1766474201802,
	author = "Bravo, J. and Vitor Santos",
	title = "Backtesting Recurrent Neural Networks with Gated Recurrent Unit: Probing with Chilean Mortality Data",
	chapter = "",
	booktitle = "Advances and Applications in Computer Science, Electronics, and Industrial Engineering. CSEI 2021. ",
	year = "2022",
	volume = "433",
	series = "",
	edition = "",
	publisher = "",
	address = "",
	url = "https://doi.org/10.1007/978-3-030-97719-1_9"
}
Export RIS 
TY  - CHAP
TI  - Backtesting Recurrent Neural Networks with Gated Recurrent Unit: Probing with Chilean Mortality Data
T2  - Advances and Applications in Computer Science, Electronics, and Industrial Engineering. CSEI 2021. 
VL  - 433
AU  - Bravo, J.
AU  - Vitor Santos
PY  - 2022
DO  - 10.1007/978-3-030-97719-1_9
UR  - https://doi.org/10.1007/978-3-030-97719-1_9
ER  -