Exportar Publicação

A publicação pode ser exportada nos seguintes formatos: referência da APA (American Psychological Association), referência do IEEE (Institute of Electrical and Electronics Engineers), BibTeX e RIS.

Exportar Referência (APA) 
Nemesio Fava Sopelsa Neto, Stefenon, Stefano Frizzo, Luiz Henrique Meyer, Ovejero, Raúl García & Valderi R. Q. Leithardt (2022). Fault Prediction Based on Leakage Current in Contaminated Insulators Using Enhanced Time Series Forecasting Models. Sensors. 22 (16), 6121
Exportar Referência (IEEE) 
N. F. Neto et al.,  "Fault Prediction Based on Leakage Current in Contaminated Insulators Using Enhanced Time Series Forecasting Models", in Sensors, vol. 22, no. 16, pp. 6121, 2022
Exportar BibTeX 
@article{neto2022_1730765771738,
	author = "Nemesio Fava Sopelsa Neto and Stefenon, Stefano Frizzo and Luiz Henrique Meyer and Ovejero, Raúl García and Valderi R. Q. Leithardt",
	title = "Fault Prediction Based on Leakage Current in Contaminated Insulators Using Enhanced Time Series Forecasting Models",
	journal = "Sensors",
	year = "2022",
	volume = "22",
	number = "16",
	doi = "10.3390/s22166121",
	pages = "6121"
}
Exportar RIS 
TY  - JOUR
TI  - Fault Prediction Based on Leakage Current in Contaminated Insulators Using Enhanced Time Series Forecasting Models
T2  - Sensors
VL  - 22
IS  - 16
AU  - Nemesio Fava Sopelsa Neto
AU  - Stefenon, Stefano Frizzo
AU  - Luiz Henrique Meyer
AU  - Ovejero, Raúl García
AU  - Valderi R. Q. Leithardt
PY  - 2022
SP  - 6121
SN  - 1424-8220
DO  - 10.3390/s22166121
ER  -