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Export Reference (APA) 
Corso, Marcelo Picolotto, Perez, Fábio Luis, Stefenon, Stefano Frizzo, Kin-Choong Yow, Ovejero, Raúl García & Valderi R. Q. Leithardt (2021). Classification of Contaminated Insulators Using k-Nearest Neighbors Based on Computer Vision. Computers. 10 (9), 112
Export Reference (IEEE) 
C. M. Picolotto et al.,  "Classification of Contaminated Insulators Using k-Nearest Neighbors Based on Computer Vision", in Computers, vol. 10, no. 9, pp. 112, 2021
Export BibTeX 
@article{picolotto2021_1764931677468,
	author = "Corso, Marcelo Picolotto and Perez, Fábio Luis and Stefenon, Stefano Frizzo and Kin-Choong Yow and Ovejero, Raúl García and Valderi R. Q. Leithardt",
	title = "Classification of Contaminated Insulators Using k-Nearest Neighbors Based on Computer Vision",
	journal = "Computers",
	year = "2021",
	volume = "10",
	number = "9",
	doi = "10.3390/computers10090112",
	pages = "112"
}
Export RIS 
TY  - JOUR
TI  - Classification of Contaminated Insulators Using k-Nearest Neighbors Based on Computer Vision
T2  - Computers
VL  - 10
IS  - 9
AU  - Corso, Marcelo Picolotto
AU  - Perez, Fábio Luis
AU  - Stefenon, Stefano Frizzo
AU  - Kin-Choong Yow
AU  - Ovejero, Raúl García
AU  - Valderi R. Q. Leithardt
PY  - 2021
SP  - 112
SN  - 2073-431X
DO  - 10.3390/computers10090112
ER  -