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Export Reference (APA) 
Morgado, T., Alves, J. M., Marcos, J., Maslovski, S., Costa, J. R., Fernandes, C. A...Silveirinha, M. G. (2014). Spatially Confined UHF RFID Detection With a Metamaterial Grid. IEEE Transactions on Antennas and Propagation. 62 (1), 378-384
Export Reference (IEEE) 
T. Morgado et al.,  "Spatially Confined UHF RFID Detection With a Metamaterial Grid", in IEEE Transactions on Antennas and Propagation, vol. 62, no. 1, pp. 378-384, 2014
Export BibTeX 
@article{morgado2014_1764941648932,
	author = "Morgado, T. and Alves, J. M. and Marcos, J. and Maslovski, S. and Costa, J. R. and Fernandes, C. A and Silveirinha, M. G.",
	title = "Spatially Confined UHF RFID Detection With a Metamaterial Grid",
	journal = "IEEE Transactions on Antennas and Propagation",
	year = "2014",
	volume = "62",
	number = "1",
	doi = "10.1109/TAP.2013.2287027",
	pages = "378-384",
	url = "http://www.it.pt/papjourn_pdf_p.asp?ID_PaperJournal=8822&id=1"
}
Export RIS 
TY  - JOUR
TI  - Spatially Confined UHF RFID Detection With a Metamaterial Grid
T2  - IEEE Transactions on Antennas and Propagation
VL  - 62
IS  - 1
AU  - Morgado, T.
AU  - Alves, J. M.
AU  - Marcos, J.
AU  - Maslovski, S.
AU  - Costa, J. R.
AU  - Fernandes, C. A
AU  - Silveirinha, M. G.
PY  - 2014
SP  - 378-384
SN  - 0018-926X
DO  - 10.1109/TAP.2013.2287027
UR  - http://www.it.pt/papjourn_pdf_p.asp?ID_PaperJournal=8822&id=1
AB  - The confinement of the detection region is one of the most challenging issues inUltra-High Frequency (UHF) Radio Frequency Identification (RFID) systems.Here, we propose a new paradigm to confine the interrogation zone of standard UHF RFID systems. Our approach relies on the use of an all-planar metamaterial wire grid to block the radiation field (i.e., the far-field) of the reader antenna, and thereby obtain a spatially well-confined detection region in the near-field. This solution is analytically and numerically investigated, and then experimentally verified through near-field and tag-reading measurements, demonstrating its effectiveness and robustness under external perturbations.
ER  -