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Export Reference (APA) 
Murteira, J.M.R., Ramalho, E.A. & Ramalho, J.J.S. (2010). A new class of conditional mean tests for binary regression models. 4th CSDA International Conference on Computational and Financial Econometrics.
Export Reference (IEEE) 
J. Murteira et al.,  "A new class of conditional mean tests for binary regression models", in 4th CSDA Int. Conf. on Computational and Financial Econometrics, London, 2010
Export BibTeX 
@misc{murteira2010_1765582053909,
	author = "Murteira, J.M.R. and Ramalho, E.A. and Ramalho, J.J.S.",
	title = "A new class of conditional mean tests for binary regression models",
	year = "2010",
	url = "http://www.cfe-csda.org/cfe10/sessions.php"
}
Export RIS 
TY  - CPAPER
TI  - A new class of conditional mean tests for binary regression models
T2  - 4th CSDA International Conference on Computational and Financial Econometrics
AU  - Murteira, J.M.R.
AU  - Ramalho, E.A.
AU  - Ramalho, J.J.S.
PY  - 2010
CY  - London
UR  - http://www.cfe-csda.org/cfe10/sessions.php
ER  -