Exportar Publicação

A publicação pode ser exportada nos seguintes formatos: referência da APA (American Psychological Association), referência do IEEE (Institute of Electrical and Electronics Engineers), BibTeX e RIS.

Exportar Referência (APA) 
Tiago M. F. Alves, Cartaxo, A. & Rebola, J. (2020). Stochastic Properties and Outage in Crosstalk-Impaired OOK-DD Weakly-Coupled MCF Applications With Low and High Skew×Bit-Rate. IEEE Journal of Selected Topics in Quantum Electronics. 26 (4), 1-8
Exportar Referência (IEEE) 
T. M. Alves et al.,  "Stochastic Properties and Outage in Crosstalk-Impaired OOK-DD Weakly-Coupled MCF Applications With Low and High Skew×Bit-Rate", in IEEE Journal of Selected Topics in Quantum Electronics, vol. 26, no. 4, pp. 1-8, 2020
Exportar BibTeX 
@article{alves2020_1765120747375,
	author = "Tiago M. F. Alves and Cartaxo, A. and Rebola, J.",
	title = "Stochastic Properties and Outage in Crosstalk-Impaired OOK-DD Weakly-Coupled MCF Applications With Low and High Skew×Bit-Rate",
	journal = "IEEE Journal of Selected Topics in Quantum Electronics",
	year = "2020",
	volume = "26",
	number = "4",
	doi = "10.1109/JSTQE.2020.2995306",
	pages = "1-8",
	url = "https://doi.org/10.1109/JSTQE.2020.2995306"
}
Exportar RIS 
TY  - JOUR
TI  - Stochastic Properties and Outage in Crosstalk-Impaired OOK-DD Weakly-Coupled MCF Applications With Low and High Skew×Bit-Rate
T2  - IEEE Journal of Selected Topics in Quantum Electronics
VL  - 26
IS  - 4
AU  - Tiago M. F. Alves
AU  - Cartaxo, A.
AU  - Rebola, J.
PY  - 2020
SP  - 1-8
SN  - 1077-260X
DO  - 10.1109/JSTQE.2020.2995306
UR  - https://doi.org/10.1109/JSTQE.2020.2995306
ER  -