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The publication can be exported in the following formats: APA (American Psychological Association) reference format, IEEE (Institute of Electrical and Electronics Engineers) reference format, BibTeX and RIS.

Export Reference (APA) 
Vinhas da Silva, Rui, Davies, G., Chun, R. & Roper, S. (2001). A corporate Personality Scale to Assess Internal and External Views of Corporate reputation. In 5th International  Conference on Corporate Reputation, Identity and Competitiveness. (pp. 0-0). Paris
Export Reference (IEEE) 
R. M. Silva et al.,  "A corporate Personality Scale to Assess Internal and External Views of Corporate reputation", in 5th Int.  Conf. on Corporate Reputation, Identity and Competitiveness, Paris, 2001, pp. 0-0
Export BibTeX 
@inproceedings{silva2001_1769466375295,
	author = "Vinhas da Silva, Rui and Davies, G. and Chun, R. and Roper, S.",
	title = "A corporate Personality Scale to Assess Internal and External Views of Corporate reputation",
	booktitle = "5th International  Conference on Corporate Reputation, Identity and Competitiveness",
	year = "2001",
	editor = "",
	pages = "0-0",
	publisher = "",
	address = "Paris",
	organization = "Reputation Institute",
	url = ""
}
Export RIS 
TY  - CPAPER
TI  - A corporate Personality Scale to Assess Internal and External Views of Corporate reputation
T2  - 5th International  Conference on Corporate Reputation, Identity and Competitiveness
AU  - Vinhas da Silva, Rui
AU  - Davies, G.
AU  - Chun, R.
AU  - Roper, S.
PY  - 2001
SP  - 0-0
CY  - Paris
ER  -